B1374
Title: Stein goodness-of-fit tests for a new family of distributions
Authors: Yvik Swan - Universite libre de Bruxelles (Belgium) [presenting]
Bruno Ebner - Karlsruhe Institute of Technology (Germany)
Abstract: A new family of distributions is introduced for which we develop bespoke goodness-of-fit tests. We illustrate our results on various family members, including many familiar distributions such as Poisson, gamma, compound Poisson, and compound geometric, as well as lesser-known distributions such as the Dickman distribution.
