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Title: Regression analyses of survival data subject to biased sampling Authors:  Yu Shen - UT MD Anderson Cancer Center (United States) [presenting]
Abstract: Methodologic development in semiparametric modeling of length-biased data has made considerable progress in recent years in many different directions. We will give an overview on recent semiparametric modeling for right-censored survival data under length-biased sampling. The methods will be reviewed for commonly used proportional hazards model, and AFT model for time-to-event outcomes, and restricted mean survival times. The estimation methods cover both estimating equation approaches and full likelihood methods using EM algorithm. Some related software for the implementation of such methods will be illustrated.