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Title: Planning of accelerated degradation tests Authors:  I-Chen Lee - National Cheng Kung University (Taiwan) [presenting]
Abstract: The accelerated degradation test (ADT) is widely used for assessing the lifetime information of highly reliable products. Because conducting an ADT is very expensive, how to plan an efficient ADT is a challenging issue for reliability analysts. By taking the experimental cost into consideration, an algorithm is proposed to determine the total sample size, testing stress levels, the measurement frequencies, and the number of measurements based on a class of exponential dispersion (ED) degradation models. For an ADT plan, the proposed method provides some design insights, and we further compare the planning strategies under different assumptions.